Perspectives of in situ/operando resonant inelastic X-ray scattering incatalytic energy materials science

淡江大學機構典藏 > 理學院 > 物理學系暨研究所 > 期刊論文 > Item 987654321/104607

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题名:	Perspectives of in situ/operando resonant inelastic X-ray scattering incatalytic energy materials science
作者:	Yi-Sheng Liu;Per-Anders Glans;Cheng-Hao Chuang;Mukes Kapilashramic;Jinghua Guo
关键词:	Soft X-ray spectroscopy;Resonant soft X-ray emission spectroscopy;Resonant inelastic soft X-ray scattering;Energy materials;In situ/operando
日期:	2015-04-01
上传时间:	2016-01-06 11:04:39 (UTC+8)
出版者:	Elsevier B.V.
摘要:	Growing environmental concerns have renewed the interest for light induced catalytic reactions to synthesize cleaner chemical fuels from syngas. This, however, requires a sound understanding for the dynamics taking place at molecular level as a result of light – matter interaction. We present herein the principles of soft X-ray resonant emission spectroscopy (RXES) and resonant inelastic scattering (RIXS) and the importance of these spectroscopic techniques in materials science in light of their unique ability to emanate characteristic fingerprints on the geometric structure, chemical bonding charge and spin states in addition to chemical sensitivity. The addition of in situ/operando RXES and RIXS capability offers new opportunities to project important material properties and functionalities under conditions nearly identical to the operational modes.
關聯:	Journal of Electron Spectroscopy and Related Phenomena 200, p.282–292
DOI:	10.1016/j.elspec.2015.07.004
显示于类别:	[物理學系暨研究所] 期刊論文

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