English  |  正體中文  |  简体中文  |  Items with full text/Total items : 51275/86342 (59%)
Visitors : 8147597      Online Users : 71
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/104593


    Title: Effect of Intermediate annealing on the structural, electrical and dielectric properties of zinc ferrite: An XANES investigation
    Authors: Singh, J. P.;Chen, C. L.;Dong, C. L.;Srivastava, R. C.;Agrawal, H. M.;Pong, W. F.;Asokan, K.
    Keywords: DIELECTRIC CONSTANT;INTERMEDIATE ANNEALING;X-RAY ABSORPTION SPECTROSCOPY;ZINC FERRITE
    Date: 2013-02-01
    Issue Date: 2016-01-06 11:04:17 (UTC+8)
    Abstract: In present work we have studied the effect of intermediate annealing (300, 500, 800 and 1000 °C) on the structural, electrical and dielectric properties of zinc ferrite synthesized by a nitrate route. Although structural properties as observed by X-ray diffraction and Raman spectroscopy do not exhibit any change with intermediate annealing, however the dielectric constant as a function of frequency and electrical resistivity as a function of temperature exhibit quiet different behavior for the sample annealed at 1000 °C. Higher resistivity of this sample is due to stronger localization of states at conduction and increase in hole states.
    Relation: Science of Advanced Materials 5(2), pp.171-181
    DOI: 10.1166/sam.2013.1444
    Appears in Collections:[物理學系暨研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML99View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback