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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/104593

    Title: Effect of Intermediate annealing on the structural, electrical and dielectric properties of zinc ferrite: An XANES investigation
    Authors: Singh, J. P.;Chen, C. L.;Dong, C. L.;Srivastava, R. C.;Agrawal, H. M.;Pong, W. F.;Asokan, K.
    Date: 2013-02-01
    Issue Date: 2016-01-06 11:04:17 (UTC+8)
    Abstract: In present work we have studied the effect of intermediate annealing (300, 500, 800 and 1000 °C) on the structural, electrical and dielectric properties of zinc ferrite synthesized by a nitrate route. Although structural properties as observed by X-ray diffraction and Raman spectroscopy do not exhibit any change with intermediate annealing, however the dielectric constant as a function of frequency and electrical resistivity as a function of temperature exhibit quiet different behavior for the sample annealed at 1000 °C. Higher resistivity of this sample is due to stronger localization of states at conduction and increase in hole states.
    Relation: Science of Advanced Materials 5(2), pp.171-181
    DOI: 10.1166/sam.2013.1444
    Appears in Collections:[Graduate Institute & Department of Physics] Journal Article

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