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    題名: Local Electronic Structure of ZnO Nanorods Grown by Radio Frequency Magnetron Sputtering
    作者: P. S. Venkatesh;C. L. Dong;C. L. Chen;W. F. Pong;K. Asokan;K. Jeganathan
    關鍵詞: ZnO nanorods;Sputtering;X-ray diffraction;X-ray absorption spectroscopy
    日期: 2014-02-01
    上傳時間: 2016-01-06 11:04:15 (UTC+8)
    摘要: We report the structural properties and local electronic structure of vertically aligned ZnO nanorods fabricated on silicon substrate without external catalyst by radio frequency magnetron sputtering. X-ray diffraction and morphological studies reveal the hexagonal wurtzite crystal structure with preferential orientation along the (002) crystallographic plane and vertical alignment of the ZnO nanorods. Angle dependent X-ray absorption near-edge spectroscopy measurements of the vertically aligned ZnO nanorods at O K and Zn L-edges divulge that the tip and side wall surfaces of the nanorods are terminated by the oxygen and zinc ions respectively.
    關聯: Materials Letters 116, pp.206–208
    DOI: 10.1016/j.matlet.2013.11.034
    顯示於類別:[物理學系暨研究所] 期刊論文

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