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    题名: Role of surface and subsurface defects in MgO thin film: XANES and magnetic investigations
    作者: J. P. Singh;C. L. Chen;C. L. Dong;J. Prakash;D. Kabiraj;D. Kanjilal;W. F. Pong;K. Asokan
    关键词: Magnetization;Magnesium oxide;X-ray absorption near edge fine structure;do ferromagnetism
    日期: 2015-01-01
    上传时间: 2016-01-06 11:03:53 (UTC+8)
    摘要: Present study reports the role of surface and subsurface defects in amorphous and polycrystalline MgO thin films. The amorphous film exhibits magnetization of the order of 179 emu/cc at room temperature, however, this value is almost 10 times smaller than the value for polycrystalline MgO film. SEM-EDX and RBS studies reveal the absence of magnetic impurities in both films. Observed magnetic properties seem to be originated from the surface states as evidenced by X-ray absorption near edge fine structure study and in correlation with the existing theories of do ferromagnetism in similar oxides
    關聯: Superlattices and Microstructures 77, pp.313–324
    DOI: 10.1016/j.spmi.2014.10.035
    显示于类别:[物理學系暨研究所] 期刊論文


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