English  |  正體中文  |  简体中文  |  Items with full text/Total items : 51931/87076 (60%)
Visitors : 8486847      Online Users : 82
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/104581


    Title: Role of surface and subsurface defects in MgO thin film: XANES and magnetic investigations
    Authors: J. P. Singh;C. L. Chen;C. L. Dong;J. Prakash;D. Kabiraj;D. Kanjilal;W. F. Pong;K. Asokan
    Keywords: Magnetization;Magnesium oxide;X-ray absorption near edge fine structure;do ferromagnetism
    Date: 2015-01-01
    Issue Date: 2016-01-06 11:03:53 (UTC+8)
    Abstract: Present study reports the role of surface and subsurface defects in amorphous and polycrystalline MgO thin films. The amorphous film exhibits magnetization of the order of 179 emu/cc at room temperature, however, this value is almost 10 times smaller than the value for polycrystalline MgO film. SEM-EDX and RBS studies reveal the absence of magnetic impurities in both films. Observed magnetic properties seem to be originated from the surface states as evidenced by X-ray absorption near edge fine structure study and in correlation with the existing theories of do ferromagnetism in similar oxides
    Relation: Superlattices and Microstructures 77, pp.313–324
    DOI: 10.1016/j.spmi.2014.10.035
    Appears in Collections:[物理學系暨研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML151View/Open
    Roleof surface and subsurface defects in MgO thin filmXANES and magnetic investigations.pdf1115KbAdobe PDF0View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback