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    题名: X-ray diffraction and Raman scattering study of thermal-induced phase transformation in verticallyaligned TiO2 nanocrystals grown on sapphire(100) via metal organic vapor deposition
    作者: Chen, C.A.;K.Y. Chen, Y.S. Huang;Tsai, D.S.;Tiong, K.K.;Chien, F.Z.
    关键词: A1. X-ray diffraction;A1. Nanostructures;A1. Raman scattering;A3. Metal organic chemical vapor deposition;B1. Nanomaterials;B1. Oxides
    日期: 2008-05-09
    上传时间: 2016-01-06 11:03:42 (UTC+8)
    摘要: We report a detailed study of thermal-induced phase transformation in TiO2 nanocrystals (NCs) via X-ray diffraction (XRD) and Raman scattering (RS) spectroscopy. Vertically aligned anatase TiO2(1 1 0) NCs were grown on the sapphire (SA)(1 0 0) substrate at 550 °C by metal organic chemical vapor deposition, using titanium-tetraisopropoxide (TTIP, Ti[OCH(CH3)2]4), as the source reagent. The effects of thermal annealing of TiO2 NCs in oxygen atmosphere between 600 and 1000 °C were investigated. XRD and RS spectra showed the onset of the phase transformation process from the as-grown anatase TiO2(1 1 0) NCs into rutile TiO2(0 0 1) at the annealing temperature of 800 °C. At annealing temperature higher than 900 °C, pure rutile phase of TiO2(0 0 1) NCs were formed and the crystalline quality of TiO2 NCs could be further improved upon higher annealing temperature.
    關聯: Journal of Crystal Growth 310(15), pp.3663–3667
    DOI: 10.1016/j.jcrysgro.2008.05.021
    显示于类别:[物理學系暨研究所] 期刊論文

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