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    題名: On the Monitoring of Simple Linear Berkson Profiles
    作者: Yi-Hua Tina Wang;Longcheen Huwang
    關鍵詞: average run length;change point;control chart;EWMA;generalized likelihood ratio
    日期: 2012-01-10
    上傳時間: 2016-01-06 11:02:13 (UTC+8)
    摘要: We consider the quality of a process, which can be characterized by a simple linear Berkson profile. One existing approach for monitoring the simple linear profile and two new proposed schemes are studied for charting the simple linear Berkson profile. Simulation studies demonstrate the effectiveness and efficiency of one of the proposed monitoring schemes. In addition, a systematic diagnostic approach is provided to spot the change point location of the process and to identify the parameter of change in the profile. Finally, an example from semiconductor manufacturing is used to illustrate the implementation of the proposed monitoring scheme and diagnostic approach.
    關聯: Quality and Reliability Engineering International
    DOI: 10.1002/qre.1286
    顯示於類別:[統計學系暨研究所] 期刊論文

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