Sensitivity analysis of sample allocation and measurement frequency under a degradation test with Gamma process

淡江大學機構典藏 > 商管學院 > 統計學系暨研究所 > 期刊論文 > Item 987654321/104545

jsp.display-item.identifier=請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/104545

题名:	Sensitivity analysis of sample allocation and measurement frequency under a degradation test with Gamma process
作者:	Chiang, Jyun-You;Sung, Wen-Yun;Tsai, Tzong-Ru;Lio, Yuh-Long
日期:	2015-03
上传时间:	2016-01-06 11:01:56 (UTC+8)
摘要:	In this study, the degradation path of a highly reliable product is modeled by Gamma process. The generalized Eyring model is used to link the shape parameter of Gamma process with the accelerated variable over experimental runs. Sensitivity of the sample size and measurement frequency on the parameter estimation of single variable constant-stress accelerated degradation test model is investigated through Monte Carlo simulations. Simulation schemes are set to accommodate a realistic accelerated degradation test experiment of high power light emitting diodes. A planning strategy for the smallest sample size and measurement frequency of the accelerated degradation test is reached with smaller bias and mean squared error of maximum-likelihood estimates of model parameters.
關聯:	ICIC Express Letters, Part B: Applications 6(3), pp. 737-742
显示于类别:	[統計學系暨研究所] 期刊論文

文件中的档案:

档案	描述	大小	格式	浏览次数
index.html		0Kb	HTML	38	检视/开启

在機構典藏中所有的数据项都受到原著作权保护.

TAIR相关文章