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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/104545


    Title: Sensitivity analysis of sample allocation and measurement frequency under a degradation test with Gamma process
    Authors: Chiang, Jyun-You;Sung, Wen-Yun;Tsai, Tzong-Ru;Lio, Yuh-Long
    Date: 2015-03
    Issue Date: 2016-01-06 11:01:56 (UTC+8)
    Relation: ICIC Express Letters, Part B: Applications 6(3), pp. 737-742
    Appears in Collections:[統計學系暨研究所] 期刊論文

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