Identifying critical success factors in EDA industry using DEMATEL method

doi:10.1080/18756891.2015.1001945

淡江大學機構典藏 > 商管學院 > 國際企業學系暨研究所 > 期刊論文 > Item 987654321/104249

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题名:	Identifying critical success factors in EDA industry using DEMATEL method
作者:	Sun, Chia-Chi
关键词:	EDA industry;Diamond mode;Critical Success Factors;Decision Making Trial and Evaluation Laboratory (DEMATEL);Mu1tiple criteria decision-making (MCDM)
日期:	2014-03-23
上传时间:	2016-01-06 10:52:52 (UTC+8)
摘要:	Electronic design automation (EDA) is a category of software tools for designing electronic systems such as printed circuit boards and integrated circuits. However, the EDA industry has been locked into virtually flat growth for the past several years. Time-to-market pressures and design complexity are critical challenges that EDA industry face today. With this background, this paper attempts to identify and analyze the Critical Success Factors (CSFs) in EDA industry. This research proposes the decision making trial and evaluation laboratory (DEMATEL) as the main analytical tool. The DEMATEL can be used as an effective method to handle the inner dependences within a set of criteria. Results show that the critical local demand condition and government are the causal competitive advantage factors for the EDA industry and could have the significant role in responding to the EDA industry. This paper draws on the research results for managerial practice implications and suggests some empirical tactics to enhance management performance for the EDA industry.
關聯:	International Journal of Computational Intelligence Systems 8(2), pp.208-218
DOI:	10.1080/18756891.2015.1001945
显示于类别:	[國際企業學系暨研究所] 期刊論文

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