Discordancy tests for two-parameter exponential samples

doi:10.1007/s00362-014-0597-3

淡江大學機構典藏 > 理學院 > 數學學系暨研究所 > 期刊論文 > Item 987654321/104241

請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/104241

題名:	Discordancy tests for two-parameter exponential samples
作者:	Chien-Tai Lin;Shih-Chun Wang
關鍵詞:	Critical values;Masking effect;Sequential testing;Spacings;Swamping effect
日期:	2015-05-13
上傳時間:	2016-01-06 10:52:34 (UTC+8)
摘要:	The inside-out sequential procedures for testing up to k upper outliers in a two-parameter exponential sample are investigated. Six test statistics, one based on the ratio of the difference of largest observation and the sample mean which are unsuspected to be outliers to the range of these observations, and others used for block test procedures discussed in Basu (J Am Stat Assoc 60:548–559, 1965), Balasooriya and Gadag (J Stat Comput Simul 50:249–259, 1994), Zerbet and Nikulin (Commun Stat Theory Methods 32:573–583, 2003) and Kumar (Testing for suspected observations in an exponential sample with unknown origin, 2013), are considered. Utilizing the recursion of Huffer (J Appl Probab 25:346–354, 1988) and algorithm of Lin and Balakrishnan (Comput Stat Data Anal 53:3281–3290, 2009), the critical values of the joint null distributions of these test statistics for sequential testing discordancy of k upper outliers in two-parameter exponential samples on the important cases k=2 and 3 are obtained. We also propose a simple procedure to determine k, which can reduce the masking or swamping effect. Powers of tests based on these statistics are compared through a Monte Carlo study.
關聯:	Statistical Papers 56(2), p.569-582
DOI:	10.1007/s00362-014-0597-3
顯示於類別:	[數學學系暨研究所] 期刊論文

文件中的檔案:

檔案	大小	格式	瀏覽次數
Discordancy tests for two-parameter exponential samples.pdf	286Kb	Adobe PDF	3	檢視/開啟
index.html	0Kb	HTML	59	檢視/開啟
index.html	0Kb	HTML	192	檢視/開啟

在機構典藏中所有的資料項目都受到原著作權保護.

TAIR相關文章

資料載入中.....