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    题名: Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process
    其它题名: 基於維納過程的加速應力驗收試驗之最佳化設計
    作者: Tsai, Chih-Chun;Lin, Chien-Tai;Balakrishnan, N.
    关键词: Cost function;optimal accelerated-stress acceptance testing time;optimal test plan;parameter misspecification;quality characteristic;sensitivity analysis
    日期: 2015-03-16
    上传时间: 2016-01-06 10:52:26 (UTC+8)
    出版者: Institute of Electrical and Electronics Engineers
    摘要: Acceptance testing is widely used to assess whether a product meets the expectations of customers. Yet, traditional acceptance tests based on time-to-failure data will not be practical because today's highly reliable products may take a long time to fail. It may be good in this case to base a test on a suitable quality characteristic (QC) whose degradation over time is related to the reliability of the product. Motivated by resistor data, we first propose a degradation model to describe the degradation paths of the resistors. Next, we present an accelerated-stress acceptance test to reduce the acceptance testing time, and then derive the optimal accelerated-stress acceptance testing time for a product, and the probability of acceptance of the batch. A model incorporating cost is also used to determine the optimal design for an accelerated-stress acceptance experiment, and a motivating example is then presented to illustrate the proposed procedure. Finally, we examine the performance of the estimators, and the effect of misspecification of the parameters on the optimal test plan through a Monte Carlo simulation study, and a detailed sensitivity analysis.
    關聯: IEEE Transactions on Reliability 64(2), p.603-612
    DOI: 10.1109/TR.2015.2410191
    显示于类别:[數學學系暨研究所] 期刊論文


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