English  |  正體中文  |  简体中文  |  Items with full text/Total items : 62797/95867 (66%)
Visitors : 3741501      Online Users : 532
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/104018


    Title: Optimal Selection of the Most Reliable Design Based on Gamma Degradation Processes
    Authors: 蔡志群
    Date: 2014-06-30
    Issue Date: 2015-10-26
    Appears in Collections:[Graduate Institute & Department of Mathematics] Proceeding

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML55View/Open
    index.html0KbHTML75View/Open
    Optimal Selection of the Most Reliable Design Based on Gamma Degradation Processes.pdf577KbAdobe PDF0View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback