English  |  正體中文  |  简体中文  |  Items with full text/Total items : 51275/86342 (59%)
Visitors : 8148013      Online Users : 143
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/103497


    Title: Economic Espionage and Investment in Research and Development
    Authors: Chen, Po-Lu
    Date: 2015-07-02
    Issue Date: 2015-08-02 22:24:18 (UTC+8)
    Abstract: This paper investigates the impact of economic espionage on innovation incentives and welfare by considering both ex ante and ex post effects of espionage. I consider two firms residing in two countries with two types of innovation, cost-reducing research and development (R&D) and information technology R&D, and find that espionage activity reduces both firms’ investment in cost-reducing R&D. The change in consumer’s welfare due to espionage depends on two offsetting effects and is ambiguous. I also discuss the effect of sales ban policy on deterring espionage. I find that sales ban policy may alternatively encourage investment in espionage activities if market size is small. Whether sales ban policy can improve consumers’ welfare depends on the market size. When market size is large that espionage activities are deterred by sales ban, then more capital devoted to cost-reducing R&D leads to higher consumer welfare. However, if market size is small that espionage is not deterred, then monopolistic position of the local firm under sales ban policy hurts local consumers.
    Appears in Collections:[經濟學系暨研究所] 會議論文

    Files in This Item:

    There are no files associated with this item.

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback