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    Title: 氧化鋅及二氧化錫奈米線在高電流密度操作下的結構變化
    Other Titles: Structural transition of ZnO/SnO2 nanowires in high current density operation
    Authors: 張志銘;Chang, Chih-Ming
    Contributors: 淡江大學物理學系碩士班
    葉炳宏;Yeh, Ping-Hung
    Keywords: 氧化鋅;二氧化錫;奈米線;奈米元件;穿透式電子顯微鏡;焦耳熱效應;電致遷移;Tin Dioxide;nanowire;Nano device;TEM;Joule heating effect;Electromigration
    Date: 2014
    Issue Date: 2015-05-04 09:47:49 (UTC+8)
    Abstract: 在本研究中將氧化鋅與二氧化錫奈米線在高電流密度操作下,可以觀察到奈米線的結構會產生變化。氧化鋅與二氧化錫奈米線在高電流密度操作後,材料之晶格結構會由原本的單晶結構轉變成多晶結構甚至是非晶結構。而結構轉變之原因,是由於奈米元件在高電流密度下操作所產生的熱效應以及電致遷移的影響,使得奈米線在結構上會發生由原本的單晶結構轉變成多晶結構甚至是非晶結構。實驗結果得知,藉由將奈米元件操作在不同的電流密度的大小,可以使奈米元件的結構發生轉變。
    In this work, the structural transitions of ZnO and SnO2 nanowires (NWs) in high current density operation can be observed. The structure of ZnO and SnO2 NWs will change from the single crystalline to the poly crystalline or the amorphous structure. The structural transition process is due to the joule heating effect by operating the nanodevice in high current density. From this research work, we can study the structural transition by tuning the current density; and about the 7.9x107 A/m2, the structure of NWs would be changed.
    Appears in Collections:[物理學系暨研究所] 學位論文

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