淡江大學機構典藏:Item 987654321/100158
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    题名: The role of nanographitic phase on enhancing the electron field emission properties of hybrid granular structured diamond films: the electron energy loss spectroscopic studies
    作者: Joji Kurian;Kamatchi Jothiramalingam Sankaran;Joseph P Thomas;Tai, N H;Chen, Huang-Chin;Lin, I-Nan;林諭男
    贡献者: 淡江大學物理學系
    日期: 2014-10
    上传时间: 2015-02-03 16:40:08 (UTC+8)
    出版者: Bristol: Institute of Physics Publishing Ltd.
    摘要: The electron field emission (EFE) properties of the hybrid granular structured diamond (HiD) films were markedly improved by N-ion implantation and annealing processes. The evolution of microstructure/bonding structure of the films due to these processes was investigated using the transmission electron microscopy (TEM) and the electron energy loss spectroscopy (EELS), respectively. The N-ion implanted/annealed HiD films showed a low turn-on field of (E0)HiD = 7.4 V µm−1 with large current density of (Je)HiD = 600 µA cm−2, at 17.8 V µm−1, compared with pristine HiD films ((E0) = 10.3 V µm−1, (Je) = 95 µA cm−2 at the same applied field). While the TEM studies revealed only the microstructural evolution due to N-ion implantation/annealing processes, the EELS elucidated the change in bonding structure, namely the transformation between the sp3-bonded carbons and the sp2-bonded ones. Therefore, the combined TEM/EELS analyses provided more insight into understand the mechanism by which the N-ion implantation/annealing processes enhanced the EFE properties of HiD films. These studies clearly demonstrated that the N-ion implantation/annealing processes induced the formation of nanographitic clusters. These nanographitic phases form an interconnected path throughout the film surface facilitating the easy transport of electrons and thereby markedly enhancing the EFE properties for the N implanted/annealed HiD films.
    關聯: Journal of Physics D: Applied Physics 47(41), 415303(14pages)
    DOI: 10.1088/0022-3727/47/41/415303
    显示于类别:[物理學系暨研究所] 期刊論文

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