淡江大學機構典藏:依題名瀏覽
English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 64185/96962 (66%)
造訪人次 : 12176233      線上人數 : 25777
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    淡江大學機構典藏 >  依題名瀏覽

    跳至: [中文]   [數字0-9]   [ A B C D E F G H I J K L M N O P Q R S T U V W X Y Z ]
    請輸入前幾個字:   

    顯示項目31451-31460 / 96940. (共9694頁)
    << < 3141 3142 3143 3144 3145 3146 3147 3148 3149 3150 > >>
    每頁顯示[10|25|50]項目
    日期題名作者
    2008-05 Test for Exponential Parameter Based on Type-I Censored Data Liang, Tachen; Huang, Wen-Tao;
    2012-07 A Test of Interpersonal Relationships in the Physical World and Cyberspace for Internet Users Yu, Chia-ping; 劉家儀;
    2002-09 The test result feedback model for content improvement in distance education 許輝煌; Hsu, Hui-huang
    1986-08 Test sequence generator Ou, Hsien-chang; Fang, Wu-shiung;
    1992-11-26 Test set compaction for combinational circuits 張昭憲; Chang, Jau-shien;
    1995-11-01 Test set compaction for combinational circuits 張昭憲; Chang, Jau-shien;
    2008-11-19 Test Slice Difference Technique for Low Power Testing 饒建奇
    2012-06 Test Slice Difference Technique for Low-Transition Test Data Compression Rau, Jiann-Chyi; Wu, Po-Han;
    1994-11-16 Test time reduction for scan-designed circuits by sliding compatibility 張昭憲; Chang, Jau-shien;
    1995-01-01 Test time reduction for scan-designed circuits by sliding compatibility 張昭憲; Chang, Jau-shien;
    顯示項目31451-31460 / 96940. (共9694頁)
    << < 3141 3142 3143 3144 3145 3146 3147 3148 3149 3150 > >>
    每頁顯示[10|25|50]項目

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋